光源類型

Light type

氙燈瞬態(tài)光源

Xenon lamp

光譜(pǔ)範圍

Spectrum wavelength

300-1200nm

300-1200nm

光源等級

Classfication of light source

光譜(pǔ)匹配(pèi)度  0.875-1.125 A+

輻照度不均(jūn)勻(yún)度  ≤1% A+

輻照度不穩(wěn)定(dìng)度  ≤1% A+

Spectral match is 0.875-1.125, class   A+

Irradiance non-uniformity is ≤1% ,  class   A+

Irradiance instability is ≤1% ,  class   A+

輻照度範圍

Irradiance intensity

200W/㎡~1200W/㎡

200W/㎡~1200W/㎡

測試面積

Illumination area

 2600*1600mm

 可定(dìng)制其他尺寸

 2600mm*1600mm ,

 Other size can be customized

脈衝寬度

Pulse duration

10-100ms ，每1ms步進(jìn)可調

10-100ms, in step of 1ms

重復性(xìng)精度

Repeatability

≤0.1%

≤0.1%

測試技(jì)術

Testing technology

標配(pèi)線性(xìng)掃描 、高級遲滯算法、集成(chéng)逐次逼近法（SAT）、智(zhì)能測試法（IAT） 、峰值保(bǎo)持(chí)測試功能

It is equipped with linear scanning ,  advanced magnetic hysteresis
, successive approximation testing technology(SAT) ,  Intelligent testing technology(IAT) and peak holding test function.

測試電池

Measurable cell type

Perc、 Topcon、BC 、異質結等高容(róng)性(xìng)電池組件

PERC , TopCon , BC, HJT and other high capacitance solar modules.

可增配(pèi)項

Optional service

 EL測試系統，實現(xiàn)同(tóng)工位(wèi)IV/EL測試

 溫(wēn)控系統 ，實現(xiàn)Panfile 、溫(wēn)度系數測試

 WPVS電池，實現(xiàn)絕對測量

 IAM旋轉支架(jià)，實現(xiàn)不同(tóng)角度測量

 低輻照度濾鏡(jìng) ，實現(xiàn)低輻照度測試

 多通道溫(wēn)度盒，實現(xiàn)多點(diǎn)溫(wēn)度測量

 EL testing system, to achieve IV testing

and EL testing at a same section.

 Temperature chamber, to achieve

Panfile testing and measurement of

temperature coefficient.

 WPVS battery, to achieve absolute

measurement.

 IAM Rotating bracket, to achieve

measurement from diffierent angles.

 Equip with optical filter for low

irradiance test

 Multi-channel temperature sensor  for

temperature measurement of multi-points.